TM 11-5821-333-30
6-6. TEST ADAPTER. Continued
g. Test Condition Switches. These are switches S7 through S13. They are used to set up different test con-
ditions for the reference and uut units, Their functions are listed in table 6-3.
Table 6-3. Test Condition Switches
SWITCH
NAME
FUNCTION
S7
CAL
Routes input FCTN GEN signals to FREQ CNTR and SCOPE 2 when set
to IN.
S8
Pi-r
Provides PTT signal (GND) to ref rt or rt uut, also to its.
S9
TAKE CTRL
Provides TAKE CTRL signal (GND) that determines when an rcu
may control an rt. The settings are:
RT: Ref rt runs independently of rcu uut or rt uut runs
independently of ref rcu.
RCU: Rcu uut controls ref rt or ref rcu controls rt uut.
S10
PT/CT
Provides signal (logic 1) to dra uut to run in cipher text mode
when set to ON. Also used to force dra uut into PT during AD2 test.
S11
SQ/CLK
When set to ON, grounds the ref dra and dra uut squelch
control (SQ CONTROL) lines, and provides connections for DIG
DATA CLK IN to each dra.
S12
RXMT
Provides logic 1 signals to dra uut to select for retransmit mode.
S13
PTT
Provides PTT signal (GND) to ref dra or dra uut, also to its.
6-7. TEST CABLES
There are 20 test cables in the maintenance group. Cables W10 through W16 are part of the electronic equip-
ment parts kit, Figure 6-5 contains a drawing and schematic of each cable. They are:
REF DES (QTY)
CONNECTS
W1
J2 of test adapter to J2 of rt uut
W2
J1 of test adapter to J1 of rt uut
W3
J6 of test adapter to J1 of rcu uut
W4
J3 of test adapter to J3 of rt uut
W5
J4 of test adapter to J4 of rt uut
W6
J5 of test adapter to J5 of rt uut
W7
J20 of test adapter to AC power supply
W8
J21 of test adapter to DC power supply
W9
J9 of test adapter to headset
W10
J7 of test adapter to dra uut
W11
TPS jack to micro RF connector
W12
J2 of test adapter to J6 of test adapter
W13
TPS plug to micro RF connector
W14
J9 of test adapter to BNC jack connector
W15
Rt uut power supply to rt uut backplane
W16 (4)
Dra uut connector housing to dra
WI 7
(Not presently used)
6-10
