6-6. TEST ADAPTER. Continued
g. Test Condition Switches. These are switches S7 through S13. They are used to set up different test con-
ditions for the reference and uut units, Their functions are listed in table 6-3.
Table 6-3. Test Condition Switches
Routes input FCTN GEN signals to FREQ CNTR and SCOPE 2 when set
Provides PTT signal (GND) to ref rt or rt uut, also to its.
Provides TAKE CTRL signal (GND) that determines when an rcu
may control an rt. The settings are:
RT: Ref rt runs independently of rcu uut or rt uut runs
independently of ref rcu.
RCU: Rcu uut controls ref rt or ref rcu controls rt uut.
Provides signal (logic 1) to dra uut to run in cipher text mode
when set to ON. Also used to force dra uut into PT during AD2 test.
When set to ON, grounds the ref dra and dra uut squelch
control (SQ CONTROL) lines, and provides connections for DIG
DATA CLK IN to each dra.
Provides logic 1 signals to dra uut to select for retransmit mode.
Provides PTT signal (GND) to ref dra or dra uut, also to its.
6-7. TEST CABLES
There are 20 test cables in the maintenance group. Cables W10 through W16 are part of the electronic equip-
ment parts kit, Figure 6-5 contains a drawing and schematic of each cable. They are:
REF DES (QTY)
J2 of test adapter to J2 of rt uut
J1 of test adapter to J1 of rt uut
J6 of test adapter to J1 of rcu uut
J3 of test adapter to J3 of rt uut
J4 of test adapter to J4 of rt uut
J5 of test adapter to J5 of rt uut
J20 of test adapter to AC power supply
J21 of test adapter to DC power supply
J9 of test adapter to headset
J7 of test adapter to dra uut
TPS jack to micro RF connector
J2 of test adapter to J6 of test adapter
TPS plug to micro RF connector
J9 of test adapter to BNC jack connector
Rt uut power supply to rt uut backplane
Dra uut connector housing to dra
(Not presently used)